JEDEC JESD 22-A117E:2018-11

Name: JEDEC JESD 22-A117E:2018-11 - Electrically Erasable Programmable ROM (EEPROM) Program / Erase Endurance and Data Retention Stress Test
Brand: JEDEC Solid State Technology Association

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Electrically Erasable Programmable ROM (EEPROM) Program / Erase Endurance and Data Retention Stress Test

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Hardcopy , PDF

Language(s)

English

Published date

11-01-2018

Publisher

JEDEC Solid State Technology Association

Superseded date

12-04-2024

Superseded by

JEDEC JESD22-A117E:2018(R2024)

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This standard specifies the procedural requirements for performing valid endurance, retention and crosstemperature tests based on a qualification specification.

Committee	JC-14.1
DocumentType	Standard
Pages	24
PublisherName	JEDEC Solid State Technology Association
Status	Superseded
SupersededBy	JEDEC JESD22-A117E:2018(R2024)
Supersedes	JEDEC JESD 22-A117D:2018

JEDEC JESD218B.03:2024

Solid-State Drive (SSD) Requirements and Endurance Test Method

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JEDEC JESD 22-A117E:2018-11

Electrically Erasable Programmable ROM (EEPROM) Program / Erase Endurance and Data Retention Stress Test

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