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JIS C 2570-2:2008

Withdrawn

Withdrawn

View Superseded by

Directly heated negative temperature coefficient thermistors -- Part 2: Sectional specification -- Surface mount negative temperature coefficient thermistors

Published date

05-20-2008

Withdrawn date

10-23-2025

Superseded by

JIS C 2570-2:2015

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DocumentType
Standard
PublisherName
Japanese Standards Association
Status
Withdrawn
SupersededBy

2008(R2013) [21/10/2013]2008 [20/05/2008]

JIS C 60068-2-78:2004 Environmental testing -- Part 2-78: Tests -- Test Cab: Damp heat, steady state Part 2-78: Tests - Test Cab: Damp heat, steady state
JIS C 60068-2-58:2006 Environmental testing -- Part 2: Tests -- Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
JIS C 2570-1:2006 Directly heated negative temperature coefficient thermistors -- Part 1: Generic specification

Sorry this product is not available in your region.