JIS K 0149-1:2008
Withdrawn
Withdrawn
View Superseded by
Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
Published date
02-20-2008
Publisher
Withdrawn date
10-23-2025
Superseded by
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| DocumentType |
Standard
|
| PublisherName |
Japanese Standards Association
|
| Status |
Withdrawn
|
| SupersededBy |
2008(R2012) [22/10/2012]2008 [20/02/2008]
| JIS Q 17025:2005 | General requirements for the competence of testing and calibration laboratories |
| JIS Q 0030:1997 | Terms and definitions used in connection with reference materials |
| JIS Q 0034:2001 | General requirements for the competence of reference material producer |
| JIS Q 0035:2008 | Reference materials -- General and statistical principles for certification |
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