JIS K 0149-1:2019
Current
Current
Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification
Published date
11-20-2019
Publisher
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| DocumentType |
Standard
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| ISO 16700:2016 | Identical |
Summarise
Sorry this product is not available in your region.