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JIS Z 9010:1999

Current

Current

Sequential sampling plans for inspection by variables for percent nonconforming (known standard deviation)

Available format(s)

PDF

Language(s)

English

Published date

10-31-1999

US$81.55
Excluding Tax where applicable

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This Japanese Industrial Standard specifies sequential sampling plans and procedures of inspection by variables of discrete items. It is complementary to JIS Z 9009. The plans in the main body of the standard are indexed in terms of the producer’s risk point and the consumer’s risk point. Annex A specifies sequential sampling plans and procedures indexed in terms of the acceptable quality level (AQL) to supplement the system of sampling plans in JIS Z 9015-1. The purpose of the Standard is to provide procedures based on a sequential assessment of inspection results, that may be used to induce the supplier through the economic and psychological pressure of non-acceptance of lots of inferior quality to supply lots of a quality having a high-probability of acceptance. At the same time the consumer is protected by a prescribed upper limit to the probability of accepting lots of poor quality.

DocumentType
Standard
Pages
48
ProductNote
Japanese PDF version unavailable from Intertek Inform.
PublisherName
Japanese Standards Association
Status
Current

Standards Relationship
ISO 8423:1991 Identical

Reaffirmed 2014 1999(R2014) [20/10/2014]1999(R2009) [01/10/2009]1999 [20/05/1999]1979

JIS Z 8101-2:1999 Statistics -- Vocabulary and symbols Part 2: Statistical quality control terms Part 2: Statistical quality control terms
JIS Z 9015-1:2006 Sampling procedures for inspection by attributes -- Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection
JIS Z 9009:1999 Sequential sampling plans for inspection by attributes
JIS Z 8101-1:1999 Statistics -- Vocabulary and symbols -- Part 1: Probability and general statistical terms Part 1: Probability and general statistical terms

JIS K 0306:2004 Measuring method for volatile organic compounds in airborne by gas detector tube
JIS Z 9015-0:1999 Sampling procedures for inspection by attributes -- Part 0: Introduction to the JIS Z 9015 attribute sampling system Part 0: Introduction to the JIS Z 9015 attribute sampling system

US$81.55
Excluding Tax where applicable