JIS Z 9015-1:2006
Current
Sampling procedures for inspection by attributes -- Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection Part 1: Sampling schemes indexed by acceptance quality limit (AQL) for lot-by-lot inspection
English
11-20-2006
This part of JIS Z 9015 specifies an acceptance sampling system for inspection by attributes.
| DocumentType |
Standard
|
| Pages |
88
|
| ProductNote |
Japanese PDF version unavailable from Intertek Inform.
|
| PublisherName |
Japanese Standards Association
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| ISO 2859-1:1999 | Identical |
Reaffirmed 2016
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| JIS Z 9015-0:1999 | Sampling procedures for inspection by attributes -- Part 0: Introduction to the JIS Z 9015 attribute sampling system Part 0: Introduction to the JIS Z 9015 attribute sampling system |
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| JIS C 5101-23-1:2008 | Fixed capacitors for use in electronic equipment -- Part 23-1: Blank detail specification -- Fixed surface mount metallized polyethylene naphthalate film dielectric DC capacitors -- Assessment level EZ |
| JIS K 3351:2009 | Glycerines for industrial use |
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| JIS Z 9080:2004 | Sensory analysis -- Methodology |
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