MIL-PRF-19500-631 Revision C:2019
Withdrawn
Transistor, Field Effect, N-Channel Silicon, Radiation Hardened (Total Dose and Single Event Effects), Types 2N7395, 2N7396, 2N7397, and 2N7398, Quality Levels JANSD and JANSR (NO S/S DOCUMENT)
English
10-26-2019
08-28-2025
This specification covers the performance requirements for a N-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event characterization only), power transistors.
| DocumentType |
Standard
|
| Pages |
22
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Withdrawn
|
| Supersedes |
This specification covers the performance requirements for a N-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event characterization only), power transistors. One level of product assurance (JANS)is provided for each device type as specified in MIL-PRF-19500.
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