MIL-STD-989 Base Document:1991
Withdrawn
CERTIFICATION REQUIREMENTS FOR JAN SEMICONDUCTOR DEVICES (NO S/S DOCUMENT)
English
11-11-1991
07-28-1995
Establishes the minimum requirements for the certification of manufacturing facilities/lines used in fabricating, assembling and testing high reliability JAN semiconductors in accordance with MIL-S-19500.
| DocumentType |
Standard
|
| Pages |
32
|
| PublisherName |
US Military Specs/Standards/Handbooks
|
| Status |
Withdrawn
|
This standard establishes the minimum requirements for the certification of manufacturing facilities/lines (s) used in fabricating, assembling, and testing high reliability JAN semiconductors in accordance the MIL-S-19500.
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| ASTM F 47 : 1994 | Test Method for Crystalographic Perfection of Silicon by Preferential Etch Techniques (Withdrawn 1998) |
| ASTM F 121 : 1983 : EDT 1 | Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption (Withdrawn 1989) |
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