NBN EN 60749-6 : 2003
Current
Current
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 6: STORAGE AT HIGH TEMPERATURE
Published date
01-12-2013
Publisher
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Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Determines and test the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied.
| DocumentType |
Standard
|
| PublisherName |
Belgian Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-6:2016-09 (Draft) | Identical |
| UNE-EN 60749-6:2003 | Identical |
| I.S. EN 60749-6:2017 | Identical |
| BS EN 60749-6:2017 | Identical |
| NF EN 60749-6 : 2002 | Identical |
| EN 60749-6:2017 | Identical |
Summarise
Sorry this product is not available in your region.