NF EN 60749-6 : 2002
Withdrawn
Withdrawn
View Superseded by
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 6: STORAGE AT HIGH TEMPERATURE
Published date
01-12-2013
Publisher
Withdrawn date
10-07-2021
Superseded by
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Foreword
1 Scope
2 Normative references
3 Test apparatus
4 Procedure
5 Summary
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Determines and test the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied.
| DevelopmentNote |
Indice de classement: C96-022-6. (03/2003) Supersedes NF EN 60749. (06/2007)
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| DocumentType |
Standard
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| PublisherName |
Association Francaise de Normalisation
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| Status |
Withdrawn
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| SupersededBy |
| Standards | Relationship |
| I.S. EN 60749-6:2017 | Identical |
| NBN EN 60749-6 : 2003 | Identical |
| IEC 60749-6:2017 | Identical |
| BS EN 60749-6:2002 | Identical |
| EN 60749-6:2017 | Identical |
| DIN EN 60749-6:2016-09 (Draft) | Identical |
| UNE-EN 60749-6:2003 | Identical |
| BS EN 60749-6:2017 | Identical |
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