NF EN 60749-6:2017
Current
Current
Semiconductor devices - Mechanical and climatic test methods – Part 6: Storage at high temperature
Published date
06-01-2017
Publisher
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The purpose of this part of IEC 60749 is to test and determine the effect on all solid state electronic devices of storage at elevated temperature without electrical stress applied.
| Committee |
TC 47
|
| DocumentType |
Test Method
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-6:2017 | Identical |
| EN 60749-6:2017 | Identical |
Summarise
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