NEN EN IEC 60749-2 : 2002
Current
Current
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 2: LOW AIR PRESSURE
Published date
01-12-2013
Publisher
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Defines the testing of low air pressure on semiconductor devices.
| DevelopmentNote |
Supersedes NEN EN IEC 60749. (09/2011)
|
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 60749-2:2002 | Identical |
| IEC 60749-2:2002 | Identical |
Summarise
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