NEN EN IEC 61967-6 : 2002 C1 2010
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INTEGRATED CIRCUITS; MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ; PART 6: MEASUREMENT OF CONDUCTED EMISSIONS; MAGNETIC PROBE METHOD
01-12-2013
Defines a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1000 MHz. This method is applicable to the measurement of a single IC or a chip set if ICs on the standardized test board for characterization and comparison purposes.
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