IEC 61967-6:2002+AMD1:2008 CSV

FOREWORD
1 Scope
2 Normative references
3 Definitions
4 General
  4.1 Measurement philosophy
  4.2 Measurement principle
5 Test conditions
  5.1 General
  5.2 Frequency range
6 Test equipment
  6.1 General
  6.2 Magnetic probe
  6.3 Probe spacing fixture and placement
7 Test set-up
  7.1 General
  7.2 Probe calibration
  7.3 Modifications to standardized IC test board
      7.3.1 Layer arrangement
      7.3.2 Layer thickness
      7.3.3 Decoupling capacitors
      7.3.4 I/O pin loading
8 Test procedure
  8.1 General
  8.2 Test technique
9 Test report
  9.1 General
  9.2 Documentation
Annex A (normative) Probe calibration procedure - Microstrip
        line method
Annex B (informative) Measurement principle and calibration
        factor
Annex C (informative) Spatial resolution of magnetic probe
Annex D (informative) Angle pattern of probe placement
Annex E (informative) Advanced magnetic probe
Bibliography

IEC 61967-6 Ed 1.1:2008 specifies a method for evaluating RF currents on the pins of an integrated circuit (IC) by means of non-contact current measurement using a miniature magnetic probe. This method is capable of measuring the RF currents generated by the IC over a frequency range of 0,15 MHz to 1 000 MHz. This method is applicable to the measurement of a single IC or a chip set of ICs on the standardized test board for characterization and comparison purposes. It is also usable to evaluate the electromagnetic characteristics of an IC or group of ICs on an actual application PCB for emission reduction purposes. This method is called the "magnetic probe method". This consolidated version consists of the first edition (2002) and its amendment 1 (2008). Therefore, no need to order amendment in addition to this publication.