PN EN 61967-6 : 2003 AMD 1 2008
Current
Current
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC EMISSIONS, 150 KHZ TO 1 GHZ - PART 6: MEASUREMENT OF CONDUCTED EMISSIONS - MAGNETIC PROBE METHOD
Published date
01-12-2013
Publisher
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Summarise this standard
AI-generated summary
| Committee |
TC 60
|
| DocumentType |
Standard
|
| PublisherName |
Polish Committee for Standardization
|
| Status |
Current
|
| Standards | Relationship |
| IEC 61967-6:2002+AMD1:2008 CSV | Identical |
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