NEN NPR IEC/PAS 62396-2 : 2007
Superseded
Superseded
View Superseded by
PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR THE SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS
Published date
01-12-2013
Publisher
Superseded date
09-01-2008
Superseded by
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Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons.
| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| IEC PAS 62396-2:2007 | Identical |
Summarise
Sorry this product is not available in your region.