NEN NPR IEC/TS 62396-2 : 2008
Superseded
Superseded
View Superseded by
PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS
Published date
11-23-2012
Publisher
Superseded date
10-01-2012
Superseded by
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Gives guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons.
| DevelopmentNote |
Supersedes NEN NPR IEC/PAS 62396-2. (09/2008)
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| DocumentType |
Standard
|
| PublisherName |
Netherlands Standards
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| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
| Standards | Relationship |
| IEC TS 62396-2:2008 | Identical |
Summarise
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