NF EN 60749-32 : 2003 AMD 1 2011
Current
Current
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)
Published date
01-12-2013
Publisher
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Foreword
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.
| DevelopmentNote |
Indice de classement: C96-022-32. (12/2003) Supersedes NF EN 60749. (06/2007)
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| DocumentType |
Standard
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| PublisherName |
Association Francaise de Normalisation
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| Status |
Current
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| Standards | Relationship |
| DIN EN 60749-32:2011-01 | Identical |
| UNE-EN 60749-32:2004 | Identical |
| BS EN 60749-32 : 2003 | Identical |
| I.S. EN 60749-32:2003 | Identical |
| IEC 60749-32:2002+AMD1:2010 CSV | Identical |
Summarise
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