UNE-EN 60749-29:2011
Current
Current
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
11-01-2011
Publisher
US$89.89
Excluding Tax where applicable
Summarise this standard
AI-generated summary
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| I.S. EN 60749-29:2011 | Equivalent |
| BS EN 60749-29:2011 | Equivalent |
| EN 60749-29:2011 | Identical |
| IEC 60749-29:2011 | Identical |
US$89.89
Excluding Tax where applicable
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