UNE-EN 60749-37:2008
Superseded
Superseded
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
07-01-2008
Publisher
Superseded date
01-01-2023
US$86.79
Excluding Tax where applicable
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
23
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Superseded
|
| Standards | Relationship |
| IEC 60749-37:2008 | Identical |
| EN 60749-37:2008 | Identical |
| BS 6045-1:1981 | Identical |
| DIN EN 60749-37:2008-08 | Equivalent |
| I.S. EN 60749-37:2008 | Equivalent |
| BS EN 60749-37:2008 | Equivalent |
Summarise
US$86.79
Excluding Tax where applicable
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