UNE-EN 62374:2007
Superseded
Superseded
Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007). (Endorsed by AENOR in February of 2008.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
02-01-2008
Publisher
Superseded date
11-01-2013
US$90.68
Excluding Tax where applicable
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
25
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Superseded
|
| Standards | Relationship |
| EN 62374:2007 | Identical |
| IEC 62374:2007 | Identical |
| BS EN 62374:2007 | Equivalent |
| I.S. EN 62374:2007 | Equivalent |
Summarise
US$90.68
Excluding Tax where applicable
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