UTEC 93 023 : 1980
Withdrawn
Withdrawn
ELECTRONIC COMPONENTS; CONNECTION BY CRIMPING OF WIRES WITH COPPER & COPPER ALLOY CONDUCTOR WITH CROSS-SECTIONAL AREA LESS THAN 10 MM SQUARED; APPLICABLE TO MULTICONTACT COMPONENTS; PROVISIONAL REQUIREMENTS
Published date
01-12-2013
Publisher
Withdrawn date
06-05-2000
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| DocumentType |
Standard
|
| PublisherName |
Association Francaise de Normalisation
|
| Status |
Withdrawn
|
| NFC 93 428 : 81 AMD 1 87 | ELECTRONIC COMPONENTS - CONNECTING DEVICES - INSULATION DISPLACEMENT CONNECTORS - TYPE HE 10 - GENERAL REQUIREMENTS |
| NFC 93 521 : 72 AMD 2 77 | ELECTRONIC COMPONENTS - LOW FREQUENCY EQUIPMENT WIRES AND CABLES WITH SOLID OR STRANDED CONDUCTORS - PVC INSULATION AND SHEATH - GENERAL REQUIREMENTS |
| NFL 54 128 : 1974 | HAND CRIMPING TOOL FOR ELECTRICAL CONTACTS - INDENTORS (NEW TYPES) |
| NFC 20 130 : 2004 | CRIMP-TYPE COPPER OR COPPER ALLOY NON-INSULATED LUGS FOR COPPER CONDUCTORS - REQUIREMENTS |
| NFC 20 600 : 1975 | TEST METHODS FOR COMPONENTS - BASIC ENVIRONMENTAL TESTING PROCEDURES - GENERAL |
| NFC 20 604 : 1973 | METHODS OF TEST FOR COMPONENTS - BASIC ENVIRONMENTAL TESTING PROCEDURES - TEST 4B - ACCELERATED DAMP HEAT |
| NFL 54 126 : 1974 | HAND CRIMPING TOOL FOR ELECTRICAL CONTACTS - INDENTORS (OLD TYPES) (RECH.) |
| NFC 93 523 : 1988 | ELECTRONIC COMPONENTS - INSULATED WIRES FOR HIGH TEMPERATURE |
| NFC 20 619 : 1987 | BASIC ENVIRONMENTAL TESTING PROCEDURES - TEST METHODS - TEST Z/ADBM AND GUIDANCE - CLIMATIC SEQUENCE |
| NFC 93 524 : 1981 | ELECTRONIC COMPONENTS - INSULATED WIRES FOR HIGH TEMPERATURES UP TO ISO GRADE C - GENERAL REQUIREMENTS |
| NFA 03 253 : 72 FD | ALUMINIUM AND ALUMINIUM ALLOYS - COPPER AND COPPER ALLOYS - VICKER HARDNESS - TEST-LOADS RANGING FROM 0.2 TO 120 KGF |
| NFC 93 050 : 1987 | ELECTRONIC COMPONENTS - BASIC ELECTRICAL TESTING PROCEDURES |
Summarise
Sorry this product is not available in your region.