DSCC 10018 : A
|
FILTER, EMI, HYBRID, 15 AMP
|
MIL-STD-1580 Revision B:2003
|
DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS
|
DSCC 98026 : C
|
FILTER, EMI, HYBRID
|
DSCC 13010 : A
|
FILTER, EMI, HYBRID, 28 V DC
|
BS EN 62258-1:2010
|
Semiconductor die products Procurement and use
|
01/206130 DC : DRAFT AUG 2001
|
IEC 62258 - SEMICONDUCTOR DIE PRODUCTS - MINIMUM REQUIREMENTS FOR PROCUREMENT AND USE - PART 1: GENERAL REQUIREMENTS - MECHANICAL, MATERIAL AND CONNECTIVITY
|
DSCC 95010 : D
|
FILTER, EMI AND TRANSIENT SUPPRESSION, HYBRID
|
DSCC 09004 : 0
|
RESISTOR, CHIP, FIXED, FILM, PRECISION, TOP CONTACT, STYLE 2020
|
MIL-PRF-83419 Revision F:2016
|
ALTIMETER, SERVO CONTROLLED, AUTOMATIC PRESSURE STANDBY
|
EIA 557 : 2006
|
STATISTICAL PROCESS CONTROL SYSTEMS
|
I.S. EN 62258-1:2010
|
SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
|
ISO 20188:2018
|
Space systems — Product assurance requirements for commercial satellites
|
SAE AS 6171 : 2016
|
TEST METHODS STANDARD; GENERAL REQUIREMENTS, SUSPECT/COUNTERFEIT, ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL PARTS
|
DSCC 06023 : B
|
FILTER, EMI, HYBRID, 28V DC
|
MIL-STD-883 Revision K:2016
|
TEST METHOD STANDARD - MICROCIRCUITS
|
EN 62258-1:2010
|
Semiconductor die products - Part 1: Procurement and use
|
MIL STD 11991 : A
|
GENERAL STANDARD FOR PARTS, MATERIALS, AND PROCESSES
|
DSCC 00003 : C#CAN
|
FILTER, EMI, HYBRID
|
DSCC 94010 : F
|
FILTER, EMI, HYBRID
|
MIL-PRF-83532-1 Revision C:2015
|
DELAY LINES, 14-PIN DIP COMPATIBLE, 5 TAP
|
SAE AS 6171/7 : 2016
|
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY ELECTRICAL TEST METHODS
|
MIL-STD-1835 Revision D:2004
|
ELECTRONIC COMPONENT CASE OUTLINES
|
DSCC 07004 : C
|
FILTER, EMI, HYBRID, 28 V DC
|
DSCC 98027 : C
|
FILTER, EMI, HYBRID
|
DSCC 13011 : A
|
FILTER, EMI, HYBRID, 28 V DC
|
DSCC 06024 : B
|
FILTER, EMI, HYBRID, 28V DC
|
DSCC 06004 : B
|
FILTER, EMI, HYBRID
|
MIL-HDBK-780 Revision D:2004
|
STANDARD MICROCIRCUIT DRAWINGS
|
MIL-PRF-83532-7 Revision B:2006
|
Delay Lines, Active, 16-Pin Dip Compatible, Programmable 3-Bit, TTL Compatible, with Input Buffer (No S/S Document)
|
SAE ARP 6328 : 2016
|
GUIDELINE FOR DEVELOPMENT OF COUNTERFEIT ELECTRONIC PARTS; AVOIDANCE, DETECTION, MITIGATION, AND DISPOSITION SYSTEMS
|
DSCC 95003 : D
|
FILTER, EMI, HYBRID
|
PD ES 59008-2:1999
|
Data requirements for semiconductor die Vocabulary
|
GEIA STD 0006 : 2008
|
REQUIREMENTS FOR USING ROBOTIC HOT SOLDER DIP TO REPLACE THE FINISH ON ELECTRONIC PIECE PARTS
|
NASA MSFC STD 3012 : 2012
|
ELECTRICAL, ELECTRONIC, AND ELECTROMECHANICAL (EEE) PARTS MANAGEMENT AND CONTROL REQUIREMENTS FOR MSFC SPACE FLIGHT HARDWARE
|
DSCC 94028 : E
|
FILTER, EMI AND TRANSIENT SUPPRESSION, HYBRID
|
MIL-M-38510-140 Revision A:2004
|
Microcircuits, Linear, Monolithic and Hybrid Silicon, Microprocessor Compatible, 12 Bit Analog-to-Digital Converters
|
MIL-PRF-83532-4 Revision C:2015
|
DELAY LINES, 14-PIN DIP COMPATIBLE, 3 DELAY CIRCUITS PER PACKAGE
|
MIL-PRF-83532-3 Revision C:2015
|
DELAY LINES, 14-PIN DIP COMPATIBLE, 10 TAP
|
CEI EN 62258-1 : 2011
|
SEMICONDUCTOR DIE PRODUCTS - PART 1: PROCUREMENT AND USE
|
MIL-PRF-28750 Revision J:2017
|
RELAYS, SOLID STATE, GENERAL SPECIFICATION FOR
|
17/30318744 DC : 0
|
BS ISO 20188 - SPACE SYSTEMS - PRODUCT ASSURANCE REQUIREMENTS FOR COMMERCIAL SATELLITES
|
DSCC 10016 : A
|
FILTER, EMI, HYBRID, 5 AMP
|
MIL-PRF-83532-2 Revision D:2015
|
DELAY LINES, 14-PIN DIP COMPATIBLE, 5 TAP
|
DSCC 11016 : A
|
FILTER, EMI, HYBRID
|
DSCC 95004 : J
|
FILTER, EMI, HYBRID
|
DSCC 06005 : C
|
FILTER, EMI, HYBRID
|
DSCC 10015 : A
|
FILTER, EMI, HYBRID, 3 AMP
|
DSCC 96003 : F
|
FILTER, EMI, HYBRID
|
MIL-PRF-83726 Revision H:2017
|
Relays, Hybrid and Solid State, Time Delay, General Specification for
|
MIL-PRF-55310 Revision E:2006
|
OSCILLATOR, CRYSTAL CONTROLLED, GENERAL SPECIFICATION FOR
|
DSCC 13009 : B
|
FILTER, EMI, HYBRID, 28 V DC
|
DSCC 91020 : F
|
FILTER, EMI, HYBRID
|
DSCC 10017 : A
|
FILTER, EMI, HYBRID, 8 AMP
|
IEC 62258-1:2009
|
Semiconductor die products - Part 1: Procurement and use
|