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IEEE DRAFT 1671 : D5 2006

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

AUTOMATIC TEST MARKUP LANGUAGE (ATML) FOR EXCHANGING AUTOMATIC TEST EQUIPMENT AND TEST INFORMATION VIA XML

Withdrawn date

18-10-2023

Published date

12-01-2013

1 Overview
  1.1 Scope
  1.2 Purpose
  1.3 Application
  1.4 Conventions used within this document
2 Normative references
3 Definitions, acronyms and abbreviations
  3.1 Definitions
  3.2 Acronyms and Abbreviations
4 Automatic Test Markup Language
  4.1 Background
  4.2 Purpose
  4.3 ATML and the Product Life Cycle
  4.4 ATML Framework
  4.5 Specification Techniques
  4.6 ATML Component Standards
  4.7 XML Schema Names and Locations
5 Conformance
6 Extensibility
Annex A (normative) XML Schema Style Guidelines
      A.1 Naming Conventions
      A.2 XML Declaration
      A.3 ATML Namespaces
      A.4 Versioning
      A.5 Documentation
      A.6 Design
Annex B (normative) ATML Common Element Schemas
      B.1 Schema- Common.xsd
      B.2 Schema- HardwareCommon.xsd
Annex C (informative) Architecture Examples
      C.1 Diagnostics
      C.2 Instruments
      C.3 Test Descriptions
      C.4 Runtime Services
Annex D (informative) Glossary
Annex E (informative) Bibliography

Describes a standard exchange medium for sharing information between components of automatic test systems. This information includes test data, resource data, diagnostic data, and historic data. The exchange medium is defined using the eXtensible Markup Language (XML). This document specifies the framework for the family of ATML standards.

DocumentType
Draft
PublisherName
Institute of Electrical & Electronics Engineers
Status
Withdrawn

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