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SEMI C34 : 2013(R 2019)

Current

Current

The latest, up-to-date edition.

SPECIFICATION AND GUIDELINE FOR MIXED ACID ETCHANTS

Available format(s)

Hardcopy

Language(s)

English

Published date

12-01-2013

Specifies requirements for mixed acid etchants used in the semiconductor industry and testing procedures to support those standards.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (05/2001) Supersedes SEMI C2-1 & SEMI C7.19. (03/2005)
DocumentType
Revision
Pages
0
PublisherName
Semiconductor Equipment & Materials Institute
Status
Current
Supersedes

ASTM F 1708 : 2002 Standard Practice for Evaluation of Granular Polysilicon by Meter-Zoner Spectroscopies (Withdrawn 2003)
SEMI MF391 : 2010E TEST METHODS FOR MINORITY CARRIER DIFFUSION LENGTH IN EXTRINSIC SEMICONDUCTORS BY MEASUREMENT OF STEADY-STATE SURFACE PHOTOVOLTAGE
SEMI MF1708 : 2004 PRACTICE FOR EVALUATION OF GRANULAR POLYSILICON BY MELTER-ZONER SPECTROSCOPIES

SEMI C2 : 1995 SPECIFICATIONS FOR ETCHANTS
SEMI C1 : 2010 GUIDE FOR THE ANALYSIS OF LIQUID CHEMICALS

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