METALLIC COATINGS ON NON-METALLIC BASIS MATERIALS - MEASUREMENT OFCOATING THICKNESS - MICRORESISTIVITY METHOD

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

01-01-2005

Publisher

German Institute for Standardisation (Deutsches Institut für Normung)

Foreword
1 Scope
2 Measurement principle
3 Factors affecting measurement uncertainty
4 Calibration of instruments
5 Procedure
6 Accuracy requirements
7 Test report
Annex A (normative) Method for determining the critical
current path width
Bibliography

Describes a method for nondestructive measurements of the thickness of conductive coatings on nonconductive base materials.

DocumentType	Standard
Pages	12
PublisherName	German Institute for Standardisation (Deutsches Institut für Normung)
Status	Current

Standards	Relationship
ONORM EN 14571 : 2005	Identical
EN 14571:2005	Identical
NBN EN 14571 : 2005	Identical
SN EN 14571 : 2006	Identical
NEN EN 14571 : 2005	Identical
NS EN 14571 : 1ED 2005	Identical
UNE-EN 14571:2006	Identical
UNI EN 14571 : 2005	Identical
BS EN 14571:2005	Identical
NF EN 14571 : 2005	Identical
I.S. EN 14571:2005	Identical