Name: IEEE 1671.5-2015 REDLINE
Brand: IEEE
Price: 145.73 AUD

IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

08-05-2015

Publisher

Institute of Electrical & Electronics Engineers

1 Overview
2 Normative references
3 Definitions, acronyms, and abbreviations
4 TestAdapterDescription Schema
5 Schema - TestAdapterInstance.xsd
6 ATML TestAdapterDescription XML schema
  names and locations
7 ATML XML schema extensibility
8 Conformance
Annex A (informative) - IEEE download website
        material associated with this document
Annex B (informative) - Users information and
        examples
Annex C (informative) - Glossary
Annex D (informative) - Bibliography

This standard defines an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description of test adapter instance information.

Committee	SCC20 - Test and Diagnosis for Electronic Sys
DevelopmentNote	PDF along with XML Schemas and reference example files is also available in zip format. (05/2015) Also numbered as IEC 61671-5. (04/2016)
DocumentType	Standard
ISBN	978-0-7381-9622-0
Pages	52
PublisherName	Institute of Electrical & Electronics Engineers
Status	Current
Supersedes	IEEE 1671.5-2008

DEFSTAN 66-031(PT8)/2(2016) : 2016	REQUIREMENTS FOR ELECTRONIC AND ELECTRICAL TEST AND MEASUREMENT EQUIPMENT - PART 8: REQUIREMENTS FOR AUTOMATIC TEST SYSTEMS UTILISING AN OPEN SYSTEM ARCHITECTURE
DEFSTAN 00-52/4(2014) : 2014	THE GENERAL REQUIREMENTS FOR PRODUCT ACCEPTANCE AND MAINTENANCE TEST SPECIFICATIONS AND TEST SCHEDULES
IEC 61671:2012	Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML
BS IEC 61671:2012	IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML
IEEE 1671.1-2009	IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML: Exchanging Test Descriptions
IEEE 1871.2-2017	IEEE Recommended Practice for IEEE 1671 Test Equipment Templates and Extension Classes for Describing Intrinsic Signal Path Information for Cables, Interface Adapters, and Test Equipment

IEEE 1671-2010

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Equipment and Test Information via XML

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IEEE 1671.5-2015 REDLINE

IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description

Table of Contents

Abstract

General Product Information

Standards Referenced By This Book

Standards Referencing This Book

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