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NEN
NEN-IEC 63229:2021

NEN-IEC 63229:2021

Current

Current

The latest, up-to-date edition.

Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate

Available format(s)

Hardcopy

Language(s)

English

Published date

01-05-2021

Publisher

Netherlands Standards

NEN-IEC 63229 gives guidelines for the definition and classification of defects in GaN epitaxial film grown on SiC substrate.

DocumentType
Standard
ISBN
978-2-8322-9669-1
Pages
0
ProductNote
This standard is identical to:- IEC 63229:2021.
PublisherName
Netherlands Standards
Status
Current

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Hardcopy - English
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