GEIA 4900 : 2001
Current
The latest, up-to-date edition.
USE OF SEMICONDUCTOR DEVICES OUTSIDE MANUFACTURERS' SPECIFIED TEMPERATURE RANGES
Hardcopy , PDF
English
01-01-2001
1 Scope
2 References
3 Terms and Definitions
4 Objectives
5 Using Devices Outside the Manufacturer's Specified
Temperature Ranges
Annex A - Device Parameter Re-characterization
Annex B - Stress Balancing
Annex C - Parameter Conformance Assessment
Annex D - Higher Assembly Level Testing
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