• Shopping Cart
    There are no items in your cart
We noticed you’re not on the correct regional site. Switch to our AMERICAS site for the best experience.
Dismiss alert
Meet Inform Select. Always-on access to the Standards your organisation relies on. Explore Inform Select

07/30170374 DC : DRAFT AUG 2007

Current

Current

The latest, up-to-date edition.

BS EN 61751-2 - LASER MODULES USED FOR TELECOMMUNICATIONS - RELIABILITY ASSESSMENT - PART 2: TECHNICAL REPORT ON LASER MODULE DEGRADATION

Published date

23-11-2012

Sorry this product is not available in your region.

BS EN 61751-2

Committee
GEL/86/3
DocumentType
Draft
PublisherName
British Standards Institution
Status
Current

MIL-STD-883 Revision K:2016 Microcircuits
IEC 60749-1:2002 Semiconductor devices - Mechanical and climatic test methods - Part 1: General
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
ISO 9000:2015 Quality management systems — Fundamentals and vocabulary
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature
IEC 61751:1998 Laser modules used for telecommunication - Reliability assessment

Sorry this product is not available in your region.