09/30193787 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS EN 62026-7 - LOW-VOLTAGE SWITCHGEAR AND CONTROLGEAR - CONTROLLER-DEVICE INTERFACES (CDIS) - PART 7: COMPONET
Hardcopy , PDF
English
31-07-2013
1 Scope
2 Normative references
3 Terms, definitions, symbols, abbreviated terms and
conventions
3.1 Terms and definitions
3.2 Symbols and abbreviated terms
4 Classification
4.1 General
4.2 Network specifications
4.3 Components
4.4 CompoNet communication model
4.5 CompoNet and CIP
5 Characteristics
5.1 Communication cycle
5.2 Messaging protocol
5.3 CompoNet communication object classes
5.4 Network access state machine
5.5 I/O connection
5.6 TDMA
5.7 Physical layer
6 Product information
7 Normal service, mounting and transport conditions
7.1 Normal service conditions
7.2 Conditions during transport and storage
7.3 Mounting
8 Constructional and performance requirements
8.1 Indicators and configuration switches
8.2 CompoNet cable
8.3 Terminators
8.4 Connectors
8.5 Node power supply implementation
8.6 Miswiring protection
8.7 Electromagnetic compatibility (EMC)
9 Tests
9.1 General
9.2 Electrical testing
9.3 Mechanical test
9.4 Logical test
Annex A (normative) - CompoNet common services
Annex B (normative) - CompoNet error codes
B.1 General
B.2 Additional error codes
Annex C (normative) - Connection path attribute definition
Annex D (normative) - Data type specification and encoding
D.1 General
D.2 CompoNet CRC Algorithms
Annex E (normative) - Communication objects library
Annex F (normative) - Value ranges
Annex G (normative) - CN default time domain
G.1 Introduction
G.2 CN default time domain tables
Bibliography
BS EN 62026-7
| Committee |
PEL/17/2
|
| DocumentType |
Draft
|
| Pages |
204
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| ISO/IEC 7498-1:1994 | Information technology — Open Systems Interconnection — Basic Reference Model: The Basic Model |
| IEC 61158-6-2:2014 | Industrial communication networks - Fieldbus specifications - Part 6-2: Application layer protocol specification - Type 2 elements |
| IEC 61000-4-11:2004+AMD1:2017 CSV | Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests |
| IEC 62026-3:2014 | Low-voltage switchgear and controlgear - Controller-device interfaces (CDIs) - Part 3: DeviceNet |
| IEC 62026-1:2007 | Low-voltage switchgear and controlgear - Controller-device interfaces (CDIs) - Part 1: General rules |
| IEC 60529:1989+AMD1:1999+AMD2:2013 CSV | Degrees of protection provided by enclosures (IP Code) |
| IEC 61000-4-2:2008 | Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test |
| IEC 61000-4-3:2006+AMD1:2007+AMD2:2010 CSV | Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test |
| IEC 61131-2:2017 | Industrial-process measurement and control - Programmable controllers - Part 2: Equipment requirements and tests |
| IEC 61158-5-2:2014 | Industrial communication networks - Fieldbus specifications - Part 5-2: Application layer service definition - Type 2 elements |
| CISPR 11:2015 RLV | Industrial, scientific and medical equipment - Radio-frequency disturbance characteristics - Limits and methods of measurement |
| IEC 61076-2-101:2012 | Connectors for electronic equipment - Product requirements - Part 2-101: Circular connectors - Detail specification for M12 connectors with screw-locking |
| IEC 60512-1:2001 | Connectors for electronic equipment - Tests and measurements - Part 1: General |
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