10/30205425 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
BS IEC 62047-12 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 12: A METHOD FOR FATIGUE TESTING THIN FILM MATERIALS USING THE RESONANT VIBRATION OF A MEMS STRUCTURE
Hardcopy , PDF
English
30-11-2011
1 Scope
2 Normative references
3 Definitions
4 Test equipment
5 Specimen
6 Test conditions
7 Initial measurement
8 Test
9 Test Report
Annex A (Informative) - Testing using an electrostatic
device with an integrated actuation component
and displacement detection component
Annex B (Informative) - Testing using an external drive
and a device with an integrated strain gauge for
detecting displacement
Annex C (Informative) - Electromagnetic drive
out-of-plane vibration test (external drive
vibration test)
Annex D (Informative) - Theoretical expression on fatigue
life of brittle materials based on Paris' law and
Weibull distribution
Annex E (Informative) - Analysis examples
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
25
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 62047-2:2006 | Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials |
| IEC 62047-3:2006 | Semiconductor devices - Micro-electromechanical devices - Part 3: Thin film standard test piece for tensile testing |
| ISO 12107:2012 | Metallic materials — Fatigue testing — Statistical planning and analysis of data |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.