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13/30203230 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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BS ISO 13095 - SURFACE CHEMICAL ANALYSIS - ATOMIC FORCE MICROSCOPY - PROCEDURE FOR IN SITU CHARACTERIZATION OF AFM PROBE SHANK PROFILE USED FOR NANOSTRUCTURE MEASUREMENT

Available format(s)

Hardcopy , PDF

Language(s)

English

Superseded date

31-08-2014

Superseded by

BS ISO 13095:2014

£20.00
Excluding VAT

Foreword
Introduction
1 Scope
2 Normative reference(s)
3 Terms and definitions
4 Symbols (and abbreviated terms)
5 Procedure for probe characterization
6 Reporting of probe characteristics
Annex A (informative) - Dependence of AFM images on
        measurement mode and settings
Annex B (normative) - Reference sample preparation
Annex C (informative) - Example of a reference structure
Annex D (informative) - Results of EPSC measurement
        repeatability test
Annex E (informative) - Plane correction for probe shank
        profile analysis
Annex F (informative) - Example of a report
Bibliography

BS ISO 13095

Committee
CII/60
DocumentType
Draft
Pages
28
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

ISO 11039:2012 Surface chemical analysis — Scanning-probe microscopy — Measurement of drift rate
ISO 18115-2:2013 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy

£20.00
Excluding VAT