15/30318551 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS EN 62276 ED. 3.0 - SINGLE CRYSTAL WAFERS FOR SURFACE ACOUSTIC WAVE (SAW) DEVICE APPLICATION - SPECIFICATIONS AND MEASURING METHODS
Hardcopy , PDF
English
31-12-2016
1 Scope
2 Normative references
3 Terms and definitions
4 Requirements
5 Sampling plan
6 Test methods
7 Identification, labelling, packaging,
delivery condition
8 Measurement of Curie temperature
9 Measurement of lattice constant (Bond
method)
10 Measurement of face angle by X-ray
11 Measurement of bulk resistivity
12 Visual inspections
Annex A (normative) - Expression using
Euler angle description
for piezoelectric single Crystals
Annex B (informative) - Manufacturing process
for SAW wafers
BS EN 62276 Ed. 3.0.
| Committee |
EPL/49
|
| DocumentType |
Draft
|
| Pages |
39
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| ISO 4287:1997 | Geometrical Product Specifications (GPS) — Surface texture: Profile method — Terms, definitions and surface texture parameters |
| IEC 61019-1:2004 | Surface acoustic wave (SAW) resonators - Part 1: Generic specification |
| IEC 60410:1973 | Sampling plans and procedures for inspection by attributes |
| IEC 60862-1:2015 | Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification |
| IEC 60758:2016 | Synthetic quartz crystal - Specifications and guidelines for use |
| IEC 61019-2:2005 | Surface acoustic wave (SAW) resonators - Part 2: Guide to the use |
| IEC 60862-2:2012 | Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use |
| IEC 60862-3:2003 | Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines |
| IEC 61019-3:1991 | Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections |
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