15/30319018 DC : 0
NA
Status of Standard is Unknown
BS EN 62951-1 ED 1.0 - SEMICONDUCTOR DEVICES - FLEXIBLE AND STRETCHABLE SEMICONDUCTOR DEVICES - PART 1: BENDING TEST METHOD FOR CONDUCTIVE THIN FILMS ON FLEXIBLE SUBSTRATES
Hardcopy , PDF
English
1 Scope
2 Normative references
3 Terms, definitions and symbols
4 Test piece
5 Testing method and test apparatus
6 Test report
Annex A (informative) - X-Y-theta bending test method
Annex B (informative) - Data analysis: Calculation of
bending radius and bending strain
Bibliography
BS EN 62951-1 Ed 1.0.
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
14
|
| PublisherName |
British Standards Institution
|
| Status |
NA
|
| IEC 62047-2:2006 | Semiconductor devices - Micro-electromechanical devices - Part 2: Tensile testing method of thin film materials |
| IEC 62047-22:2014 | Semiconductor devices - Micro-electromechanical devices - Part 22: Electromechanical tensile test method for conductive thin films on flexible substrates |
Please Login or Create an Account so you can add users to your Multi user PDF Later.
Important note : All end users must be registered with an Account prior to user licenses being assigned.
Users cannot be edited or removed once added to your Multi user PDF.