15/30320811 DC : 0
NA
Status of Standard is Unknown
BS EN 62433-2 - EMC IC MODELING - PART 2: MODELS OF INTEGRATED CIRCUITS FOR EMI BEHAVIOURAL SIMULATION - CONDUCTED EMISSIONS MODELING (ICEM-CE)
Hardcopy , PDF
English
FOREWORD
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICEM-CE basic components
6 IC macro-models
7 CEML format
8 Requirements for parameter extraction
Annex A (normative) - Preliminary definitions for XML
representation
Annex B (normative) - CEML Valid keywords and usage
Annex C (informative) - Example of ICEM-CE model
in CEML format
Annex D (informative) - Conversions between parameter
types
Annex E (informative) - Model parameter generation
Annex F (informative) - Decoupling capacitors
optimization
Annex G (informative) - Conducted emission prediction
Annex H (informative) Conducted emission prediction
at PCB level
Bibliography
BS EN 62433-2.
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
95
|
| PublisherName |
British Standards Institution
|
| Status |
NA
|
| IEC 61967-4:2002+AMD1:2006 CSV | Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method |
| ISO 8879:1986 | Information processing — Text and office systems — Standard Generalized Markup Language (SGML) |
| CISPR 17:2011 | Methods of measurement of the suppression characteristics of passive EMC filtering devices |
| IEC TS 62433-1:2011 | EMC IC modelling - Part 1: General modelling framework |
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