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16/30338636 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

BS IEC 62047-30 - SEMICONDUCTOR DEVICES - MICRO-ELECTROMECHANICAL DEVICES - PART 30: MEASUREMENT METHODS OF ELECTRO-MECHANICAL CONVERSION CHARACTERISTICS OF MEMS PIEZOELECTRIC THIN FILM

Available format(s)

Hardcopy , PDF

Language(s)

English

Superseded date

31-10-2017

£20.00
Excluding VAT

FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test bed of MEMS piezoelectric
  thin film
5 Thin film under testing
6 Test report
Annex A (informative) - Example of measuring
        method of MEMS piezoelectric thin film
Bibliography

BS IEC 62047-30.

Committee
EPL/47
DocumentType
Draft
Pages
38
PublisherName
British Standards Institution
Status
Superseded

EN 50324-2:2002 Piezoelectric properties of ceramic materials and components - Part 2: Methods of measurement - Low power
IEC 60483:1976 Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling

£20.00
Excluding VAT