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16/30344796 DC : 0

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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BS EN 60749-6 - SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 6: STORAGE AT HIGH TEMPERATURE

Available format(s)

Hardcopy , PDF

Language(s)

English

Superseded date

30-11-2017

Superseded by

BS EN 60749-6:2002

£20.00
Excluding VAT

1 Scope
2 Test apparatus
3 Procedure
4 Summary
Bibliography

BS EN 60749-6.

Committee
EPL/47
DocumentType
Draft
Pages
9
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

IEC 60749-20:2008 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
IEC 60749-43:2017 Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

£20.00
Excluding VAT