ESD SP5.5.2 : 2007
Current
Current
The latest, up-to-date edition.
ELECTROSTATIC DISCHARGE SENSITIVITY TESTING - VERY FAST TRANSMISSION LINE PULSE (VF-TLP) - COMPONENT LEVEL
Published date
12-01-2013
Publisher
Applies to very fast transmission line pulse (VF-TLP) testing techniques of semiconductor components. It provides guidelines and standard practices presently used by development, research, and reliability engineers in both universities and industry for VF-TLP testing.
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