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IEC 63011-2:2018

Current

Current

The latest, up-to-date edition.

Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect

Available format(s)

Hardcopy , PDF , PDF 3 Users , PDF 5 Users , PDF 9 Users

Language(s)

English - French

Published date

28-11-2018

IEC 63011-2:2018 provides specifications of initial alignment and alignment maintenance between multiple stacked integrated circuits during the die bonding process. These specifications define the alignment keys and operating procedures of the keys. These specifications apply only if electrical coupling method of die-to-die alignment is used in the die stacking.

Committee
TC 47/SC 47A
DocumentType
Standard
ISBN
978-2-8322-6291-7
Pages
28
ProductNote
THIS STANDARD ALSO REFERS TO IEC 63011-1, IEC 63011-3
PublisherName
International Electrotechnical Committee
Status
Current

Standards Relationship
BS IEC 63011-2:2018 Identical

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