SAE AS 6171/4 : 2016
Current
The latest, up-to-date edition.
TECHNIQUES FOR SUSPECT/COUNTERFEIT EEE PARTS DETECTION BY DELID/DECAPSULATION PHYSICAL ANALYSIS TEST METHODS
Hardcopy , PDF
English
30-10-2016
1. SCOPE
2. REFERENCES
3. DESCRIPTION OF THE METHODOLOGY/PROCEDURE - MICROCIRCUITS,
HYBRIDS, DIODES, AND TRANSISTORS
4. DESCRIPTION OF THE PROCEDURE - RESISTORS, CAPACITORS,
INDUCTORS, FILTERS, CONNECTORS, CABLES, FUSES, TRANSFORMERS
(PASSIVE DEVICES)
5. TEST EQUIPMENT, TEST SAMPLES, AND CALIBRATION
6. DETAILED REQUIREMENTS
7. ALTERNATE PACKAGE/MATERIAL TYPES
8. NOTES
APPENDIX A - DECAPSULATION AND PHOTO-DOCUMENTATION EXAMPLES
APPENDIX B - VISUAL ANOMALY EXAMPLES
APPENDIX C - UNACCEPTABLE DECAPSULATION RESULTS
APPENDIX D - PROFICIENCY SAMPLE QUESTIONS (FOR INTERNAL USE ONLY)
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