ASTM F 1467 : 2011-10
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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GUIDE FOR USE OF AN X-RAY TESTER ([APPROXIMATE] 10 KEV PHOTONS) IN IONIZING RADIATION EFFECTS TESTING OF SEMICONDUCTOR DEVICES AND MICROCIRCUITS
Published date
01-10-2011
Superseded date
31-08-2020
Superseded by
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CONTAINED IN VOL. 10.04, 2018 Defines recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having approximately equal to 10 ke V mean photon energy and approximately equal to 50 ke V maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing radiation.
| Committee |
F 01
|
| DocumentType |
Redline
|
| PublisherName |
American Society for Testing and Materials
|
| Status |
Superseded
|
| SupersededBy |
| MIL STD 11991 : A | GENERAL STANDARD FOR PARTS, MATERIALS, AND PROCESSES |
| MIL-HDBK-817 Base Document:1994 | System Development Radiation Hardness Assurance |
| MIL-STD-883 Revision K:2016 | Microcircuits |
| ASTM E 170 : 2017 : REDLINE | Standard Terminology Relating to Radiation Measurements and Dosimetry |
| ASTM E 668 : 2013 : REDLINE | Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices |
| ASTM E 1249 : 2015 : REDLINE | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
| ASTM E 1894 : 2013-07 | GUIDE FOR SELECTING DOSIMETRY SYSTEMS FOR APPLICATION IN PULSED X-RAY SOURCES |
| ASTM E 666 : 2014 : REDLINE | Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation |
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