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ASTM F 769 : 2000

ASTM F 769 : 2000

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Standard Test Method for Measuring Transistor and Diode Leakage Currents (Withdrawn 2006)

Available format(s)

Hardcopy , PDF

Withdrawn date

13-07-2006

Language(s)

English

Published date

10-06-2000

Publisher

American Society for Testing and Materials

CONTAINED IN VOL. 10.04, 2006 Defines test requirements for the measurement of leakage currents of transistors and diodes. Electronic devices exposed to ionizing radiation may show increases in leakage current as the accumulated total dose rises.

1.1 This test method covers the measurement of leakage currents of transistors and diodes. Electronic devices exposed to ionizing radiation may show increases in leakage current as the accumlated total dose rises.

1.2 These procedures are intended for the measurement of currents in the range from 10 -11 to 10 -3 A.

1.3 This test method may be used with either a virtual-ground current meter or a resistance-shunt current meter.

1.4 The values stated in International System of Units (SI) are to be regarded as standard. No other units of measurement are included in this test method.

1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Committee
F 01
DocumentType
Test Method
Pages
3
PublisherName
American Society for Testing and Materials
Status
Withdrawn

MIL-HDBK-817 Base Document:1994 SYSTEM DEVELOPMENT RADIATION HARDNESS ASSURANCE

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PDF - English
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