BS CECC 75100:1984
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Harmonized system of quality assessment for electronic components. Sectional specification: two-part and edge socket connectors for printed board application
Hardcopy , PDF
English
30-11-1984
15-06-1993
Methods of test and inspection procedures.
| Committee |
EPL/48
|
| DevelopmentNote |
Inactive for the new design. Superseded by BS EN 175100 but remains current. Supersedes 80/28150 DC (01/2006)
|
| DocumentType |
Standard
|
| Pages |
34
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| CECC 75100 : 1991 | Identical |
| BS CECC 75101:1984 | Specification for harmonized system of quality assessment for electronic components. Example detail specification/blank detail specification. Two-part and edge socket connectors for printed board application |
| BS 5555:1993 | Specification for SI units and recommendations for the use of their multiples and of certain other units |
| BS 9000-2(1996) : 1996 | GENERAL REQUIREMENTS FOR A SYSTEM FOR ELECTRONIC COMPONENTS OF ASSESSED QUALITY - SPECIFICATION FOR THE NATIONAL IMPLEMENTATION OF THE CECC SYSTEM |
| BS E9007:1975 | Specification for harmonized system of quality assessment for electronic components: Basic specification: Sampling plans and procedures for inspection by attributes |
| BS 4500-1:1969 | ISO limits and fits General, tolerances and deviations |
| BS 5772-2:1979 | Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods General examination, electrical continuity and contact resistance tests, insulation tests and voltage stress tests |
| BS CECC 00009:1982 | Harmonized system of quality assessment for electronic components. Basic specification: basic testing procedures and measuring methods for electromechanical components |
| BS 5772-3:1979 | Specification for electromechanical components for electronic equipment: basic testing procedures and measuring methods Current-carrying capacity tests |
| BS 6001(1972) : AMD 5054 | SAMPLING PROCEDURES FOR INSPECTION BY ATTRIBUTES - SPECIFICATION FOR SAMPLING PLANS INDEXED BY ACCEPTABLE QUALITY LEVEL (AQL) FOR LOT - BY - LOT INSPECTION |
| IEC 60050-581:2008 | International Electrotechnical Vocabulary (IEV) - Part 581: Electromechanical components for electronic equipment |
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