BS EN 160200-2:1998
Current
The latest, up-to-date edition.
Harmonized system of quality assessment for electronic components. Sectional specification. Microwave modular electronic units of assessed quality Index of test methods
Hardcopy , PDF
English
15-03-1998
Section one - General matters
1.1 Scope
1.2 Related documents
Section two - Test and measurement procedures
2.1 General
2.2 Special conditions for testing
2.3 Selection guide
2.4 Standard test methods
2.5 Special test methods
2.6 Alternative test methods
Specifies standard/reference test procedures for Electrical, Mechanical and Visual Inspection as prescribed in Part 1 of the Sectional Specification EN 160200 and Blank Detail Specification EN 160201 for Microwave Modular Electronic Units (MMEUs).
| Committee |
EPL/48
|
| DevelopmentNote |
Supersedes 93/205132 DC. (09/2005)
|
| DocumentType |
Standard
|
| Pages |
56
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| EN 160200-2 : 1997 | Identical |
| NEN EN 160200-2 : 1998 | Identical |
| I.S. EN 160200-2:1998 | Identical |
| DIN EN 160200-2:1998-05 | Identical |
| EN 160100 : 1997 | CAPABILITY APPROVAL OF MANUFACTURERS OF PRINTED BOARD ASSEMBLIES OFASSESSED QUALITY (SECTIONAL SPECIFICATION) |
| CECC 00010 : 1980 AMD 1 | BASIC SPECIFICATION: TEST METHODS FOR PRINTED BOARDS |
| EN 160200-1 : 1997 | MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - PART 1: CAPABILITY APPROVAL PROCEDURE (SECTIONAL SPECIFICATION) |
| CECC 00803 : 1995 | GUIDANCE DOCUMENT: VISUAL INSPECTION OF SOLDERED SURFACE MOUNTED ASSEMBLIES |
| CECC 45000 : 1975 | GENERIC SPECIFICATION: SPACE-CHARGE CONTROLLED TUBES |
| EN 160000 : 93 AMD 1 95 | GENERIC SPECIFICATION: MODULAR ELECTRONIC UNITS |
| EN 135000:1992 | Generic Specification: Travelling wave amplifier tubes |
| EN 136000:1992 | Generic Specification: Magnetrons |
| EN 160201 : 1997 | MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY - CAPABILITY APPROVAL (BLANK DETAIL SPECIFICATION) |
| CECC 00009 : 1980 | BASIC SPECIFICATION: BASIC TESTING PROCEDURES AND MEASURING METHODS FOR ELECTROMECHANICAL COMPONENTS |
| CECC 63000 : 84 AMD 5 | GENERIC SPECIFICATION: FILM & HYBRID INTEGRATED CIRCUITS |
| EN 169000 : 92 AMD 1 98 | HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - GENERIC SPECIFICATION: QUARTZ CRYSTAL CONTROLLED OSCILLATORS |
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