BS EN 61747-1:2000
Current
The latest, up-to-date edition.
Liquid crystal and solid-state display devices Generic specification
Hardcopy , PDF
English
31-10-2003
1 Scope
2 Normative references
3 Terminology
3.1 Physical concepts
3.2 General terms
3.3 Terms related to ratings and characteristics
4 Technical aspects
4.1 Order of precedence
4.2 Terminology, units and symbols
4.3 Preferred values of temperature, humidity and
pressure
4.4 Marking
4.4.1 Device identification
4.4.2 Device traceability
4.4.3 Packing
4.5 Categories of assessed quality
4.6 Screening
4.7 Handling
5 Quality assessment procedures
5.1 Eligibility for qualification approval
5.1.1 Primary stage of manufacture
5.2 Commercially confidential information
5.3 Formation of inspection lots
5.4 Structurally similar devices
5.5 Granting of qualification approval
5.6 Quality conformance inspection
5.6.1 Division into groups and subgroups
5.6.2 Inspection requirements
5.6.3 Supplementary procedure for reduced
inspection
5.6.4 Sampling requirements for small lots
5.6.5 Certified records of released lots
(CRRL)
5.6.6 Delivery of devices subjected to
destructive or non-destructive tests
5.6.7 Delayed deliveries
5.6.8 Supplementary procedure for deliveries
5.7 Statistical sampling procedures
5.7.1 AQL sampling plans
5.7.2 LTPD sampling plans
5.8 Endurance tests
5.9 Endurance tests where the failure rate is
specified
5.9.1 General
5.9.2 Selection of samples
5.9.3 Failure
5.9.4 Endurance test time and sample size
5.9.5 Procedure to be used if the number of
observed failures exceeds the
acceptance number
5.10 Accelerated test procedures
5.11 Capability approval
6 Test and measurement procedures
6.1 Standard atmospheric conditions for electrical
and optical measurements
6.2 Physical examination
6.2.1 Visual examination
6.2.2 Dimensions
6.2.3 Permanence of marking
6.3 Electrical and optical measurements
6.3.1 General conditions and precautions
6.4 Environmental tests
Annex A (informative) Cross references index
Annex B (informative) Example of outline drawings of liquid
crystal display cells
Annex C (normative) Orientation of LCD modules
Annex D (normative) Lot tolerance percentage defective
(LTPD) sampling plans
Tables
Generic specification defining general procedures for quality assessment for IECQ use and general rules for measuring methods of electrical and optical characteristics, climatic and mechanical tests and endurance tests.
| Committee |
EPL/100
|
| DevelopmentNote |
Renumbers and supersedes BS IEC 61747-1. 2000 version incorporates amendment 10788 to BS IEC 61747-1. Also numbered as IEC 61747-1. Supersedes 01/201646 DC & 93/203880 DC. (01/2006)
|
| DocumentType |
Standard
|
| Pages |
46
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| NF EN 61747-1 : 2000 AMD 1 2003 | Identical |
| DIN EN 61747-1:2003-12 | Identical |
| NBN EN 61747-1 : 2000 AMD 1 2004 | Identical |
| IEC 61747-1:1998/AMD1:2003 | Identical |
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