BS IEC 60747-14.3 : 2009
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - PART 14-3: SEMICONDUCTOR SENSORS - PRESSURE SENSORS
Hardcopy , PDF
English
01-01-2009
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terminology and letter symbols
3.1 General terms
3.2 Definitions
3.3 Letter symbols
4 Essential ratings and characteristics
4.1 General
4.2 Ratings (limiting values)
4.3 Characteristics
5 Measuring methods
5.1 General
5.2 Output voltage measurements
5.3 Sensitivity (S)
5.4 Temperature coefficient of sensitivity (alpha[S])
5.5 Temperature coefficient of full-scale span (alphaV[FSS])
and maximum temperature deviation of full-scale span
(deltaV[FSS])
5.6 Temperature coefficient of offset voltage (alphaV[OS])
and (deltaV[OS])
5.7 Pressure hysteresis of output voltage (H[ohp])
5.8 Temperature hysteresis of output voltage (H[ohT])
Figure 1 - Basic circuit for measurement of output voltage
Provides requirements for semiconductor pressure sensors measuring absolute, gauge, or differential pressures.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 99/204500 DC. (10/2001) Supersedes 08/30181404 DC. (07/2009)
|
| DocumentType |
Standard
|
| Pages |
24
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60747-14-3:2009 | Identical |
| IEC 60747-14-1:2010 | Semiconductor devices - Part 14-1: Semiconductor sensors - Generic specification for sensors |
| IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
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