BS IEC 60748-2.11 : 1999
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS - DIGITAL INTEGRATED CIRCUITS - BLANK DETAIL SPECIFICATION FOR SINGLE SUPPLY INTEGRATED CIRCUIT, ELECTRICALLY ERASABLE, AND PROGRAMMABLE READ-ONLY MEMORY
Hardcopy , PDF
English
01-01-1999
Foreword
Introduction
1 Marking and Ordering information
2 Application related description
3 Specification of the function
4 Limiting values (absolute maximum rating system)
5 Operating conditions (within the specified operating temperature
range)
6 Electrical characteristics
7 Programming
8 Mechanical and environmental ratings, characteristics and data
9 Additional information
10 Screening (if required)
11 Quality assessment procedures
12 Structural similarity procedures
13 Test conditions and inspection requirements
14 Additional measurement methods
Reference Documents
Table 1 - Group A: Lot-by-lot
Table 2 - Group B: Lot-by-lot
Table 3 - Group C: Periodic
Table 4 - Group D
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 91/30744 DC. (06/2005)
|
| DocumentType |
Standard
|
| Pages |
22
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60748-2-11:1999 | Identical |
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
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