BS QC700000(1991) : 1991
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
Hardcopy , PDF
31-07-2011
English
01-01-1991
Committees responsible
National foreword
Specification
1 Scope
2 General
2.1 Order of precedence
2.2 Related documents
2.3 Units, symbols and terminology
2.4 Preferred values of voltages, currents and
temperatures
2.5 Marking
2.5.1 Terminal identification
2.5.2 Type designation
2.5.3 Manufacturer's name or trade mark
2.5.4 Inspection lot identification code
2.6 Categories of assessed quality
2.7 Screening
2.8 Handling
3 Quality assessment procedures
3.1 Eligibility for qualification approval
3.1.1 Primary stage of manufacture
3.2 Commercially confidential information
3.3 Formation of inspection lots
3.4 Structurally similar devices
3.5 Granting of qualification approval
3.6 Quality conformance inspection
3.6.1 Division into groups and sub-groups
3.6.2 Inspection requirements
3.6.3 Supplementary procedure for reduced inspection
3.6.4 Sampling requirements for small lots
3.6.5 Certified Records of Released Lots (CRRL)
3.6.6 Delivery of devices subjected to destructive or
non-destructive tests
3.6.7 Delayed deliveries
3.6.8 Supplementary procedure for deliveries
3.7 Statistical sampling procedures
3.7.1 AQL (Acceptable quality level) sampling plans
3.7.2 Lot tolerance per cent defective (LTPD)
sampling plans
3.7.3 Correlation between AQL and LTPD is specified
3.8 Endurance tests where LTPD is specified
3.9 Endurance tests where the failure rate is
specified
3.9.1 General
3.9.2 Selection of samples
3.9.3 Failures
3.9.4 Endurance test time and sample size
3.9.5 Procedure to be used if the number of observed
failures exceeds the acceptance number
3.10 Accelerated test procedures
3.10.1 Requirements for eligibility in periodic
testing
3.10.2 Procedure for thermally-accelerated electrical
endurance testing
3.10.3 Damp heat (under consideration)
3.10.4 Voltage (under consideration)
3.11 Capability approval
3.11.1 General
3.11.2 Terms and definitions
3.11.3 Procedure for granting capability approval
3.11.4 Capability approval maintenance procedure
3.11.5 Procedure for reduction, extension or change of
capability approval
3.11.6 Procedure in case of deficiency in maintenance
of the capability approval
3.11.7 Capability manual
3.11.8 Capability test programme
3.11.9 Verification of capability approval (quality
audit)
3.11.10 Quality assurance of products delivered under
capability approval
3.11.11 Marking and ordering information
3.11.12 Capability abstract for publication purposes
3.11.13 Detail specifications for custom components
3.11.14 Detail specifications for catalogue products
3.11.15 Detail specification register
4 Test and measurement procedures
4.1 Standard atmospheric conditions for electrical
and optical measurements
4.2 Definition of a destructive list
4.3 Physical examination
4.3.1 Visual examination
4.3.2 Dimensions
4.3.3 Permanence of marking
4.4 Electrical and optical measurements
4.4.1 General conditions and precautions
4.5 Environmental tests
Appendices
A Lot tolerance per cent defective (LTPD)
sampling plans
Table A-I LTPD sampling plans
Table A-II Hypergeometric sampling plans for
small lot sizes of 200 or less
Table A-III AQL and LTPD sampling plans
B Dimensions to be checked
C Directions for applied forces for mechanical
tests
D Assessment of quality levels in ppm (parts
per million)
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