BS QC750100(1986) : 1986
Current
The latest, up-to-date edition.
HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - DISCRETE SEMICONDUCTOR DEVICES - SECTIONAL SPECIFICATION
Hardcopy , PDF
English
01-01-1986
1 Scope
2 General
3 Quality assessment procedures
4 Test and measurement procedures
Publications referred to
Pertains to discrete semiconductor devices, excluding opto-electronic devices.
| Committee |
EPL/47
|
| DevelopmentNote |
Also numbered as IEC 60747-11 Supersedes 80/28890 DC AMD 7208 renumbers and supersedes BS QC 750000(1986) (08/2005) 1986 Edition Re-Issued in January 2010 & incorporates AMD 2 1996. Issue Date: 31/01/2010. (01/2010)
|
| DocumentType |
Standard
|
| Pages |
22
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
| IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
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